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Inspection Equipment


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Group Offers into sub-categories under Inspection EquipmentGroup Offers into sub-categories under Inspection Equipment

List all 3 product types under Inspection EquipmentList all 3 product types under Inspection Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

23007
Buehler  

Buehler  

Carbimet Paper Discs 

List all items of this typeSample Preparation - Other

in Sample Preparation

2 50.00 F* Scotia, NY
BUEHLER CARBIMET 320 GRIT PAPER DISCS:
Paper Discs 320 Grit

Buehler part number: 30-5108-320-100
116574
Buehler  

Buehler  

Primet 

List all items of this typeSample Preparation - Other

in Sample Preparation

1 650.00 F* Scotia, NY
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:
Modular Dispensing Satellite

7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


176740
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, New York
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS).

Includes Gatan Binocular Microscope

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

78602
Hewlett Packard  

Hewlett Packard  

43804N 

List all items of this typeX-Ray Inspection Equipment - Other

in Inspection Equipment

1   F* Scotia, NY
HEWLETT PACKARD HP FAXITRON X-RAY SYSTEM 110 kV:
X-Ray System

 

100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
200588
Hewlett Packard  

Hewlett Packard  

43855B 

List all items of this typeX-Ray Inspection Equipment - Other

in Inspection Equipment

1 [2,700.00]+ F* Edgewater, New Jersey
HP Faxitron X-Ray System:
DEMO LISTING -- NOT REAL
6402
JEOL  

JEOL  

JSM 6100 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Microscope with LaB Filament
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
81042
Microspec  

Microspec  

WDX-2A(Spectrometer) 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Scotia, NY
MICROSPEC WDX-2A SPECTROMETER:
Spectrometer
1817
Precise Optics  

Precise Optics  

PS61 

List all items of this typeX-Ray Inspection Equipment - Other

in Inspection Equipment

1   F* Scotia, NY
PRECISE OPTICS X-RAY IMAGE INTENSIFIER:
6" X-Ray Image Intensifier

149933
Reichert Inc  

Reichert Inc  

Ultracut S-EM FCS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, NY
REICHERT/LEICA LOW TEMPERATURE SECTIONING SYSTEM:
Low Temperature Sectioning System
158112
RK Print Coat Inst.  

RK Print Coat Inst.  

K303 

List all items of this typeSample Preparation - Other

in Sample Preparation

1 3,200.00 F* Scotia, NY
RK PRINTCOAT INSTRUMENTS MULTI COATER:
Multi Coater



201129
Applied Materials  

Applied Materials  

SemvisionG3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

S/N : W-5002

201155
Applied Materials In  

Applied Materials In  

SEMVision G3 Lite 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

S/N : W-3002

Warm idle, in the Fab.

199706
Zeiss  

Zeiss  

Ultra 55, LEO Gemini 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Dresden, Saxony
Zeiss, Ultra 55, LEO Gemini, 300mm, SEM:
Zeiss, Ultra 55, LEO Gemini, 300mm, SEM



*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Inspection Equipment:
Applied Materials Inc., Applied Materials, Inc., Buehler, CPS, FEI, Gatan, Hewlett Packard, Hitachi, JEOL, KLA-Tencor, Microspec, Precise Optics, Reichert Inc, RK Print Coat Instruments, SELA, Zeiss