 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
| Make |
Model |
| |
|
$ |
|
 |
251076
|
Applied Materials
|
Applied Materials |
NanoSEM 3D |
Critical Dimension Scanning Electron Microscopes
in Microscopes
|
1
|
|
|
 |
Singapore |
|
|
254250
|
AMAT
|
AMAT |
UVision 6 |
Wafer Inspection Microscopes
in Optical Microscopes
|
1
|
|
|
|
Malta, New York |
|
|
252611
|
Applied Materials
|
Applied Materials |
Verity1 SEM |
Scanning Electron Microscopes
in Inspection Equipment
AMAT Verity1 SEM, 300mm, s/n: U-757:Applied VeritySEM
|
1
|
|
|
|
Singapore |
|
|
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
Scanning Electron Microscopes
in Inspection Equipment
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
|
|
Singapore |
|
|
111048
|
American Optical
|
American Optical |
1177-1 |
Fiber Optic Light Sources
in Fiber Optic Illuminators
AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
2
|
|
195.05 |
|
Scotia, New York |
|
|
171583
|
Anatech Ltd
|
Anatech Ltd |
Hummer 6.6T |
Sample Coaters
in Sample Preparation
ANATECH HUMMER 6.6T SPUTTER SYSTEM:Sputter System
|
1
|
|
|
F* |
Scotia, New York |
|
|
184614
|
ATM GmbH
|
ATM GmbH |
Brillant BR250.2 |
Cut-Off Saws
in Surface Processing Equipment
ATM GmbH CUT OFF SAW 12" :Cut-Off Saw
|
1
|
|
|
F* |
Scotia, New York |
|
|
1786
|
Bausch & Lomb
|
Bausch & Lomb |
Type A |
Stands
in Parts and Accessories, Microscope
BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:Type A Incident Light Stand
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
|
12
|
|
|
|
Scotia, New York |
|
|
1785
|
Bausch & Lomb
|
Bausch & Lomb |
312690 |
Parts and Accessories - Other
in Parts and Accessories, Microscope
BAUSCH & LOMB ER-ARM:ER-Arm
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
|
10
|
|
180.05 |
F* |
Scotia, New York |
|
|
208308
|
Bausch and Lomb
|
Bausch and Lomb |
MicroZoom |
Upright Microscopes
in Optical Microscopes
BAUSCH & LOMB INDUSTRIAL MICROSCOPE INCIDENT LIGHT:Industrial microscope with long working distance objectives.
|
1
|
|
|
F* |
Scotia, New York |
|
|
964
|
Bausch & Lomb
|
Bausch & Lomb |
MicroZoomII |
Microscopes - Other
in Optical Microscopes
BAUSCH & LOMB MICROSCOPE WORK STATION:Microscope Work Station
Long working distance objectives
|
1
|
|
|
|
Scotia, New York |
|
|
3264
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 1 |
Stereo Microscopes
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:Stereo Zoom Microscope
Microscopes listed are for pod and eyepieces only
|
13
|
|
225.06 |
|
Scotia, New York |
|
|
110365
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 2 |
Stereo Microscopes
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 2X:Stereo Zoom Microscope
Microscopes listed are for pod and eyepieces only
|
1
|
|
350.09 |
|
Scotia, New York |
|
|
1800
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 5 |
Stereo Microscopes
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:Stereo Zoom Microscope
Scopes listed include pod and eyepieces only
|
1
|
|
600.16 |
|
Scotia, New York |
|
|
159266
|
Bausch & Lomb
|
Bausch & Lomb |
SZ4 |
Stereo Microscopes
in Optical Microscopes
Bausch & Lomb Stereo Zoom 4:StereoZoom 4 Microscope with Boom Stand
|
1
|
|
|
F* |
Plano, TX |
|
|
161016
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 4 |
Stereo Microscopes
in Optical Microscopes
Bausch & Lomb StereoZoom 4:Microscope on Small Base
|
1
|
|
|
|
Plano, TX |
|
|
161018
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 6 Plus |
Stereo Microscopes
in Optical Microscopes
Bausch & Lomb StereoZoom 6 Plus:Microscope Head
|
1
|
|
|
F* |
Plano, TX |
|
|
159267
|
Bausch & Lomb
|
Bausch & Lomb |
SZ 6-ST |
Stereo Microscopes
in Optical Microscopes
Bausch & Lomb StereoZoom 6-ST:StereoZoom Microscope with Boom Stand
|
1
|
|
|
|
Plano, TX |
|
|
157435
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 7 |
Stereo Microscopes
in Optical Microscopes
BAUSCH & LOMB StereoZoom 7:Microscope & Boom Stand
|
1
|
|
|
F* |
Plano, TX |
|
|
110364
|
Bausch & Lomb
|
Bausch & Lomb |
Type K |
Stands
in Parts and Accessories, Microscope
BAUSCH & LOMB TYPE K STAND:K Stand for B&L StereoZoom Microscopes
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
E-Arm not included
|
1
|
|
|
|
Scotia, New York |
|
|
109425
|
BOOM STAND
|
BOOM STAND |
Stands
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand w/ Rectangular Horizontal Post
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
|
6
|
|
|
|
Scotia, New York |
|
|
109549
|
BOOM STAND
|
BOOM STAND |
Stands
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand w/ Rotatable Knuckle
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
|
2
|
|
|
|
Scotia, New York |
|
|
109553
|
BOOM STAND
|
BOOM STAND |
Stands
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
|
2
|
|
|
|
Scotia, New York |
|
|
109122
|
BOOM STAND
|
BOOM STAND |
Stands
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
|
19
|
|
|
F* |
Scotia, New York |
|
|
109427
|
BOOM STAND
|
BOOM STAND |
Stands
in Parts and Accessories, Microscope
BOOM STAND:Dual Arm Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
|
2
|
|
350.09 |
|
Scotia, New York |
|
|
4436
|
Buehler
|
Buehler |
Consumables |
Polishing & Grinding Sample Prep Equipment
in Sample Preparation
BUEHLER CONSUMABLES, POLISHING AND GRINDING:Polishing and Grinding Consumables
|
4
|
|
|
|
Scotia, NY |
|
|
122523
|
Buehler
|
Buehler |
Dressing Chuck |
Cut-Off Saws
in Surface Processing Equipment
BUEHLER ISOMET DRESSING CHUCK:Dressing Chuck
Representative photos
|
1
|
|
|
F* |
Scotia, New York |
|
|
142877
|
Buehler
|
Buehler |
ISOMET |
Cut-Off Saws
in Surface Processing Equipment
BUEHLER LOW SPEED CUT-OFF SAW:Precision Sectioning Saw
Representative photo - color of saw may vary
Various ISOMET chucks available.
See other information for more details.
|
2
|
|
|
|
Scotia, New York |
|
|
116574
|
Buehler
|
Buehler |
Primet |
Sample Preparation - Other
in Sample Preparation
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:Modular Dispensing Satellite
|
1
|
|
|
F* |
Scotia, New York |
|
|
7353
|
CPS
|
CPS |
6004/1958 |
Scanning Electron Microscopes
in Inspection Equipment
CPS SEM ELECTRON GUN POWER SUPPLY 30KV:Electron Gun Power Supply
CPS SEM Power Supply 6004
|
1
|
|
3,751.00 |
|
Scotia, New York |
|
|
194899
|
DELTRONIC
|
DELTRONIC |
DH14-RR |
Measuring Microscopes
in Optical Microscopes
Deltronic DH14-RR Profile Projector :Deltronic DH14-RR Profile Projector
|
1
|
|
|
|
Plano, Texas |
|
|
57426
|
Denton
|
Denton |
DESK II |
Sample Coaters
in Sample Preparation
DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :Metal Sputter
|
1
|
|
6,251.67 |
F* |
Scotia, New York |
|
|
159268
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
|
Stereo Microscopes
in Optical Microscopes
Diagnostic Instruments:Microscope Boom Stand
|
2
|
|
|
|
Plano, TX |
|
|
109548
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
SMS16-A |
Stands
in Parts and Accessories, Microscope
DIAGNOSTIC INSTRUMENTS BOOM STAND:Weighted Base Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope
E-arm not included
|
2
|
|
|
|
Scotia, New York |
|
|
86452
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
SMS16-B |
Stands
in Parts and Accessories, Microscope
DIAGNOSTIC INSTRUMENTS BOOM STAND:Boom Stand
|
1
|
|
325.09 |
F* |
Scotia, New York |
|
|
18711
|
Dolan Jenner
|
Dolan Jenner |
180 |
Fiber Optic Light Sources
in Fiber Optic Illuminators
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
1
|
|
150.04 |
F* |
Scotia, New York |
|
|
122729
|
Dolan Jenner
|
Dolan Jenner |
PL-750A- 111 |
Fiber Optic Light Sources
in Fiber Optic Illuminators
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
1
|
|
225.06 |
F* |
Scotia, NY |
|
|
134541
|
FIBER OPTIC LIGHT SOURCE
|
FIBER OPTIC LIGHT SOURCE |
Fiber Optic Light Sources
in Fiber Optic Illuminators
FIBER OPTIC LIGHT SOURCE:Remote Fiber Optic Illuminator
Model FOI-150-Remote
|
1
|
|
180.05 |
|
Scotia, New York |
|
|
134624
|
FIBER OPTIC LIGHT SOURCE
|
FIBER OPTIC LIGHT SOURCE |
Fiber Optic Light Sources
in Fiber Optic Illuminators
FIBER OPTIC LIGHT SOURCE:Fiber Optic Illuminator
Manufacturer Unknown
|
1
|
|
180.05 |
|
Scotia, New York |
|
|
35762
|
Hitachi
|
Hitachi |
S-7000 |
Critical Dimension Scanning Electron Microscopes
in Microscopes
Hitachi S-7000:CD SEM Measurement Tool
|
1
|
|
|
F* |
Plano, TX |
|
|
251081
|
HMI
|
HMI |
ESCAN380 |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
253752
|
HSEB
|
HSEB |
MMT 300 |
Wafer Inspection Microscopes
in Optical Microscopes
|
1
|
|
|
|
Dresden, Saxony |
|
|
253234
|
HSEB
|
HSEB |
MMT300 V2 |
Wafer Inspection Microscopes
in Optical Microscopes
|
1
|
|
|
|
Dresden, Saxony |
|
|
202816
|
HSEB
|
HSEB |
Axiospect 301 |
Wafer Inspection Microscopes
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
|
|
Malta, New York |
|
|
202817
|
HSEB
|
HSEB |
Axiospect 301 |
Wafer Inspection Microscopes
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
|
|
Malta, New York |
|
|
332
|
Karl Storz
|
Karl Storz |
483C |
Parts and Accessories - Other
in Parts and Accessories, Microscope
KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE :Twin Fiber Optic Light SourceLight guide not included.
|
1
|
|
350.09 |
|
Scotia, New York |
|
|
251079
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
251077
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
254255
|
KLA-Tencor
|
KLA-Tencor |
2835 |
Wafer Inspection Microscopes
in Optical Microscopes
KLA 2835, 300mm, s/n: 1340334:Brightfield Inspection
|
1
|
|
|
|
Malta, New York |
|
|
251078
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
251080
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
251617
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
257174
|
KLA-Tencor
|
KLA-Tencor |
RS100C |
Wafer Inspection Microscopes
in Optical Microscopes
|
1
|
|
|
N* |
Singapore |
|
|
255109
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
Wafer Inspection Microscopes
in Optical Microscopes
|
1
|
|
|
|
Singapore |
|
|
252339
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
Wafer Inspection Microscopes
in Optical Microscopes
|
1
|
|
|
|
Singapore |
|
|
252340
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
Wafer Inspection Microscopes
in Optical Microscopes
|
1
|
|
|
|
Singapore |
|
|
253040
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
Wafer Inspection Microscopes
in Optical Microscopes
KLA Tencor AIT II, 200mm, s/n: 9145:KLA-Tencor AIT II w/ ADC. Defect Inspection
|
1
|
|
|
|
Burlington, Vermont |
|
|
253033
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
Wafer Inspection Microscopes
in Optical Microscopes
KLA Tencor AIT II, 200mm, s/n: 9234:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
|
|
Burlington, Vermont |
|
|
254149
|
KLA-Tencor
|
KLA-Tencor |
OP3260I |
Wafer Inspection Microscopes
in Optical Microscopes
KLA Tencor OP3260I, 200mm, s/n: 6678:Film thickness measurement
|
1
|
|
|
|
Singapore |
|
|
254147
|
KLA-Tencor
|
KLA-Tencor |
UV1280SE |
Wafer Inspection Microscopes
in Optical Microscopes
KLA Tencor UV1280SE, 200mm, s/n: 991098:Film thickness measurement tool
|
1
|
|
|
|
Singapore |
|
|
253038
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
Wafer Inspection Microscopes
in Optical Microscopes
KLA-Tencor AIT II, 200mm, s/n: 9152:AIT II w/ ADC. Defect Inspection
|
1
|
|
|
|
Burlington, Vermont |
|
|
253037
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
Wafer Inspection Microscopes
in Optical Microscopes
KLA-Tencor AIT II, 200mm, s/n: 9262:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
|
|
Burlington, Vermont |
|
|
253039
|
KLA-Tencor
|
KLA-Tencor |
AIT |
Wafer Inspection Microscopes
in Optical Microscopes
|
1
|
|
|
|
Burlington, Vermont |
|
|
254084
|
KLA-Tencor
|
KLA-Tencor |
EDR 5200 |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
254087
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
254086
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
254085
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
Scanning Electron Microscopes
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
1127
|
Leco
|
Leco |
VC-50 |
Cut-Off Saws
in Surface Processing Equipment
LECO PRECISION DIAMOND CUT OFF SAW 5" BLADE:Vari/Cut Off Saw
|
1
|
|
|
F* |
Scotia, New York |
|
|
18713
|
Fostec
|
Fostec |
8300 |
Fiber Optic Light Sources
in Fiber Optic Illuminators
LEEDS FOSTEC FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source Representative photo These units are manufactured by Fostec and re-branded by different companies.
The light source received may not be branded Fostec.
|
19
|
|
|
F* |
Scotia, New York |
|
|
186519
|
Leica
|
Leica |
INM20 |
Wafer Inspection Microscopes
in Optical Microscopes
LEICA AUTOMATED WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope
Brightfield/Darkfield, DIC, With LEP motorized wafer transport system
|
1
|
|
|
F* |
Scotia, New York |
|
|
1893
|
Leica
|
Leica |
445945 |
Parts and Accessories - Other
in Parts and Accessories, Microscope
LEICA E-ARM FOCUSING DRIVE:Focusing Drive For MS5/MZ6/MZ8
|
9
|
|
|
F* |
Scotia, New York |
|
|
243053
|
Leica
|
Leica |
Polylite 88 |
Upright Microscopes
in Optical Microscopes
LEICA REICHERT BRIGHTFIELD DARKFIELD :Long Working Distance Objectives
|
1
|
|
|
F* |
Scotia, New York |
|
|
165299
|
Leica
|
Leica |
S6 E |
Stereo Microscopes
in Optical Microscopes
LEICA STEREO MICROSCOPE 6.3X - 40X:Stereo Microscope with Boom Stand and Ring Light
|
1
|
|
1,550.42 |
F* |
Scotia, New York |
|
|
192026
|
Leica
|
Leica |
S6 E |
Stereo Microscopes
in Optical Microscopes
LEICA STEREO MICROSCOPE 6.3X - 40X:Stereo Microscope with Boom Stand, Dual Light Pipes & .75X Aux lens
|
1
|
|
1,725.46 |
F* |
Scotia, New York |
|
|
37954
|
Leica
|
Leica |
INM 100 |
Upright Microscopes
in Optical Microscopes
LEICA WAFER INSPECTION MICROSCOPE, BRIGHT & DARKFIELD:Wafer Inspection Microscope
New, never used
|
1
|
|
|
F* |
Scotia, New York |
|
|
169430
|
Leica
|
Leica |
Wild M8 |
Stereo Microscopes
in Optical Microscopes
LEICA WILD STEREO MICROSCOPE 6X - 50X:Stereo Microscope
|
1
|
|
|
|
Scotia, New York |
|
|
1643
|
Leica
|
Leica |
POLYLITE88 |
Upright Microscopes
in Optical Microscopes
LEICA/REICHERT METALLURGICAL MICROSCOPE:Metallurgical Microscope - Camera and controller not included
|
1
|
|
|
F* |
Scotia, New York |
|
|
1641
|
Leica
|
Leica |
POLYLITE 88 |
Wafer Inspection Microscopes
in Optical Microscopes
LEICA/REICHERT MICROSCOPE, MANUAL WAFER INSPECTION :Manual Wafer Inspection Microscope
MicroVision MVT 1080 Wafer Loader
|
1
|
|
|
F* |
Scotia, New York |
|
|
106575
|
Leica
|
Leica |
Polylite 88 |
Upright Microscopes
in Optical Microscopes
LEICA/REICHERT MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Polylite 88 Reflected Light Microscope
|
2
|
|
|
F* |
Scotia, New York |
|
|
186513
|
Leica
|
Leica |
POLYLITE 88 |
Wafer Inspection Microscopes
in Optical Microscopes
LEICA/REICHERT WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope
Brightfield/Darkfield/DIC
With LEP motorized wafer transport system
|
1
|
|
|
|
Scotia, New York |
|
|
186518
|
Leica
|
Leica |
POLYLITE 88 |
Wafer Inspection Microscopes
in Optical Microscopes
LEICA/REICHERT WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope
Brightfield/Darkfield
With LEP motorized wafer transport system
|
1
|
|
|
F* |
Scotia, New York |
|
|
57070
|
Leitz
|
Leitz |
Laborlux 12 HL |
Upright Microscopes
in Optical Microscopes
LEITZ BRIGHTFIELD/DARKFIELD FILAR EYEPIECE:Brightfield, Darkfield and DIC
Leitz Filar Eyepiece with Boeckeler Micrometer and Readout
|
1
|
|
5,951.59 |
F* |
Scotia, New York |
|
|
47433
|
Leitz
|
Leitz |
Secolux 6X6 |
Upright Microscopes
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD:Brightfield Reflected Light Microscope
|
1
|
|
5,701.53 |
F* |
Scotia, New York |
|
|
113754
|
Leitz
|
Leitz |
Ergolux |
Upright Microscopes
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Brightfield/Darkfield Reflected Light
|
1
|
|
4,901.31 |
F* |
Scotia, New York |
|
|
89143
|
Leitz
|
Leitz |
Ergolux |
Upright Microscopes
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Brightfield Reflected Light/Transmitted Light Microscope
|
1
|
|
5,251.41 |
F* |
Scotia, New York |
|
|
256664
|
Olympus
|
Olympus |
|
Wafer Inspection Microscopes
in Optical Microscopes
Low power optical scope:Location is at Infineon Penang.
|
2
|
|
|
N* |
George Town, Penang |
|
|
18582
|
Melles Griot
|
Melles Griot |
04TFF002 |
Microscopes - Other
in Optical Microscopes
MELLES GRIOT FINE FOCUSING MICROSCOPE:Fine Focusing Microscope
|
3
|
|
450.12 |
|
Scotia, New York |
|
|
111690
|
MICROSCOPE STAND
|
MICROSCOPE STAND |
Stands
in Parts and Accessories, Microscope
MICROSCOPE STAND:Large StereoZoom Microscope Stand
Available only with purchase of a B&L, Nikon, or Olympus StereoZoom Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
|
81042
|
Microspec
|
Microspec |
WDX-2A(Spectrometer) |
Scanning Electron Microscopes
in Inspection Equipment
MICROSPEC WDX-2A SPECTROMETER:Spectrometer
|
1
|
|
|
|
Scotia, New York |
|
|
133353
|
Mitutoyo
|
Mitutoyo |
176-901-1A |
Measuring Microscopes
in Optical Microscopes
MITUTOYO TOOLMAKER'S MICROSCOPE:Toolmakers Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
|
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
Other Items
in Microscopes
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
|
|
Malta, New York |
|
|
3042
|
Nikon
|
Nikon |
|
Microscopes - Other
in Optical Microscopes
NIKON DISK INSPECTION MICROSCOPE:Disk Inspection Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
|
1899
|
Nikon
|
Nikon |
UA1 |
Parts and Accessories - Other
in Parts and Accessories, Microscope
|
7
|
|
140.04 |
|
Scotia, New York |
|
|
62898
|
Nikon
|
Nikon |
E-Arm |
Parts and Accessories - Other
in Parts and Accessories, Microscope
|
21
|
|
140.04 |
F* |
Scotia, New York |
|
|
109820
|
Nikon
|
Nikon |
Focusing Stand |
Stands
in Parts and Accessories, Microscope
NIKON FOCUSING STAND:Focusing Stand With Diascopic Illuminator Base
Available only with purchase of Nikon Stereozoom Microscope
|
2
|
|
|
|
Scotia, New York |
|
|
110421
|
Nikon
|
Nikon |
Focusing Stand |
Stands
in Parts and Accessories, Microscope
NIKON FOCUSING STAND:Focusing Stand
Available only with purchase of Nikon Stereozoom Microscope
|
1
|
|
250.07 |
|
Scotia, New York |
|
|
249588
|
Nikon
|
Nikon |
Labophot 2 |
Upright Microscopes
in Optical Microscopes
|
1
|
|
|
|
Plano, Texas |
|
|
3253
|
Nikon
|
Nikon |
None |
Microscopes - Other
in Optical Microscopes
NIKON LARGE SUBSTRATE INSPECTION MICROSCOPE:Large Substrate Inspection Microscope
With Brightfield and Darkfield Illumination
12" x 8" XY Stage
|
1
|
|
|
F* |
Scotia, New York |
|
|
189203
|
Nikon
|
Nikon |
XD-20 |
Upright Microscopes
in Optical Microscopes
NIKON LARGE SUBSTRATE INSPECTION MICROSOPE:Brightfield, Darkfield, POL
Reflected and Transmitted Light
N.B. The Kinetic Systems optical table that the Nikon Microscope is on is not included. However, it is for sale. More information at Kinetic Systems 1201-04-11
|
1
|
|
|
F* |
Scotia, New York |
|
|
152742
|
Nikon
|
Nikon |
MM-11B |
Measuring Microscopes
in Optical Microscopes
NIKON MEASURING MICROSCOPE:Measuring Microscope
|
1
|
|
|
|
Scotia, New York |
|
Displaying 1-100 of 195 Page  1 2  |
Log in
How to post your own listings
View prices in $ or ... 
ALL CATEGORIES 
reference document attached
.png)
.png)
.png)
.png)
